ebsd analyses Search Results


electron backscatter diffraction (ebsd) detector  (Carl Zeiss)
90
Carl Zeiss electron backscatter diffraction (ebsd) detector
Electron Backscatter Diffraction (Ebsd) Detector, supplied by Carl Zeiss, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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ebsd analyses esprit 1.94  (Bruker Corporation)
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Bruker Corporation ebsd analyses esprit 1.94
Ebsd Analyses Esprit 1.94, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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ebsd-eds analyses  (ONERA The French Aerospace Lab)
90
ONERA The French Aerospace Lab ebsd-eds analyses
Ebsd Eds Analyses, supplied by ONERA The French Aerospace Lab, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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ebsd aztec hkl advanced nordlys nano analyser  (JEOL)
90
JEOL ebsd aztec hkl advanced nordlys nano analyser
Ebsd Aztec Hkl Advanced Nordlys Nano Analyser, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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electron microprobe  (ONERA The French Aerospace Lab)
90
ONERA The French Aerospace Lab electron microprobe
Electron Microprobe, supplied by ONERA The French Aerospace Lab, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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sem and ebsd analyses  (JEOL)
90
JEOL sem and ebsd analyses
Grain size of the poly-Ge layers. ( a – c ) <t>SEM</t> and ( d–f <t>)</t> <t>EBSD</t> images of the samples annealed at 450 °C with T d = ( a,d ) 50 °C ( b,e ) 125 °C, and ( c,f ) 200 °C. The coloration in the EBSD images indicates the crystal orientation according to the legend inserted in ( d ). ( g ) Average grain size determined by the EBSD analyses for samples with T g = 375 °C, 400 °C, and 450 °C as a function of T d . The data determined by the electrical properties of samples with T g = 450 °C are also shown.
Sem And Ebsd Analyses, supplied by JEOL, used in various techniques. Bioz Stars score: 90/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
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Image Search Results


Grain size of the poly-Ge layers. ( a – c ) SEM and ( d–f ) EBSD images of the samples annealed at 450 °C with T d = ( a,d ) 50 °C ( b,e ) 125 °C, and ( c,f ) 200 °C. The coloration in the EBSD images indicates the crystal orientation according to the legend inserted in ( d ). ( g ) Average grain size determined by the EBSD analyses for samples with T g = 375 °C, 400 °C, and 450 °C as a function of T d . The data determined by the electrical properties of samples with T g = 450 °C are also shown.

Journal: Scientific Reports

Article Title: High-hole mobility polycrystalline Ge on an insulator formed by controlling precursor atomic density for solid-phase crystallization

doi: 10.1038/s41598-017-17273-6

Figure Lengend Snippet: Grain size of the poly-Ge layers. ( a – c ) SEM and ( d–f ) EBSD images of the samples annealed at 450 °C with T d = ( a,d ) 50 °C ( b,e ) 125 °C, and ( c,f ) 200 °C. The coloration in the EBSD images indicates the crystal orientation according to the legend inserted in ( d ). ( g ) Average grain size determined by the EBSD analyses for samples with T g = 375 °C, 400 °C, and 450 °C as a function of T d . The data determined by the electrical properties of samples with T g = 450 °C are also shown.

Article Snippet: The SEM and EBSD analyses were performed using a JEOL JSM-7001F with a TSL OIM analysis attachment.

Techniques: